X-ray blood sterilization is utilizing an X-ray source which produces x-rays that are suitable for surface and volume sterilization of blood products, but also other materials like foodstuffs, packaged goods and medical supplies.
Security is monitored and controlled by means of an x-ray source that produces x-rays applied in parcel scanners, airport luggage scanners, harbor container and cargo scanners, truck scanners, etc.
NDT (Non-destructive testing) is conducted by means of an x-ray source that produces x-rays to have a 100% product quality check applied in zero defect quality control environments with complex, continues manufacturing processes.
Food inspection is conducted by means of an x-ray source that produces x-rays that detect food non-conformities in for instance; baby food.
Thickness gauging is conducted by means of an x-ray source that produces x-rays that measure thickness of steel plates in steel manufacturing processes.
X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology.
X-ray diffraction (XRD) is a versatile, non-destructive technique that reveals detailed information about the chemical composition and crystallographic structure of natural and manufactured materials.
Transmission Electron Microscopy (TEM) is an imaging technique whereby a beam of electrons is transmitted through a specimen, then an image is formed, magnified and directed to appear either on a fluorescent screen or layer of photographic film, or to be detected by a sensor such as a CCD camera.
Scanning Electron Microscopy (SEM) is a type of electron microscope capable of producing high-resolution images of a sample surface. Due to the manner in which the image is created, SEM images have a characteristic three-dimensional appearance and are useful for judging the surface structure of the sample.
Focussed Ion Beam (FIB) is a scientific instrument that resembles a scanning electron microscope. FIB uses a focused beam of gallium ions. Gallium is chosen because it is easy to build a gallium liquid metal ion source (LMIS). In a Gallium LMIS, gallium metal is placed in contact with a tungsten needle and heated. Gallium wets the tungsten, and a huge electric field (greater than 108 volts per centimeter) causes ionization and field emission of the gallium atoms. A modern FIB can deliver tens of nanoamps of current to a sample, or can image the sample with a spot size on the order of a few nanometers.Unlike an electron microscope, the FIB is inherently destructive to the specimen. Becau of the sputtering capability, the FIB is used as a micro-machining tool, to modify or machine materials at the micro- and nanoscale.
